Metrology of low-photon light sources

Abstract

In the report the parameterization of few-photon light sources is discussed. This question relates to a new area of research in quantum optics - the development of methods for characterizing optical components and devices used in optical quantum technologies that are supposed to be used in industry. Apart from, the recent results in this field obtained in the Laboratory of Experimental Quantum Optics and Nanophotonics of M.V.Lomonosov Moscow State University are briefly presented