The Method of Correction Hysteresis Piezoscanner Atomic Force Microscope

Abstract

The method of correcting software hysteresis piezoscanner atomic force microscope was proposed. The algorithm for correction was used for the samples of silicon, mica, polysulfone, and human erythrocytes, and platelets. It is shown that the proposed method can effectively eliminate the difference between the curves of supply and discharge of the working area due to piezo hysteresis and is valid for different delay times between measurements at neighboring points of these curves.

Keywords

• piezo hysteresis
• static force spectroscopy
• the point of contact