AIP Advances (Feb 2023)

Suppression of substrate temperature in DC magnetron sputtering deposition by magnetic mirror-type magnetron cathode

  • Taisei Motomura,
  • Kenshin Takemura,
  • Toshimi Nagase,
  • Nobutomo Morita,
  • Tatsuo Tabaru

DOI
https://doi.org/10.1063/5.0138840
Journal volume & issue
Vol. 13, no. 2
pp. 025153 – 025153-5

Abstract

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Magnetron sputtering generally increases the temperature of the substrate placed to face the sputtering target above 40 °C because the plasmas are transported through unbalanced magnetic field lines from the sputtering target to the substrate surface. However, by using a magnetic mirror-type magnetron cathode, we were able to suppress the temperature of the substrate temperature to the environmental temperature of less than 40 °C at a target–substrate distance of ≥50 mm with a DC input power of ≤30 W and an Ar gas pressure of ≤0.15 Pa. This was possible because the balanced magnetic field lines confined the plasmas near the sputtering target. By enabling film deposition on low heat-resistant substrates, this deposition technique for suppressing the substrate temperature may have uses in various application fields.