Journal of Synchrotron Radiation (Jul 2025)

Versatile X-ray reflector extension setup for grazing-incidence experiments at SAXS facilities for liquid surface study

  • Andrei Chumakov,
  • Jan J. Rubeck,
  • Matthias Schwartzkopf

DOI
https://doi.org/10.1107/s1600577525003431
Journal volume & issue
Vol. 32, no. 4
pp. 961 – 970

Abstract

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Existing beamlines for in situ grazing-incidence small-angle scattering on liquids are either limited in angular range or incompatible with the large sample–detector distance required for submicrometre resolution. We present a low-cost, easily assembled beam-tilting extension for synchrotron-based ultra-small-angle X-ray scattering (USAXS) facilities, enabling grazing-incidence and transmitted scattering (GIUSAXS, GTUSAXS) studies on liquid surfaces. The setup is compatible with standard USAXS beamlines and requires only ∼0.5 m of additional space at the sample stage. It allows X-ray beam incidence angles of up to ∼0.6° at the liquid surface, equal to twice the angle of incidence on a reflector and below its critical angle of typical materials (e.g. silicon, germanium, etc.), and provides access to a q-range of approximately 0.003–0.5 nm−1. The system was tested at P03 beamline (DESY) using polystyrene nanoparticles (∼197 nm) self-assembled at the air/water interface. The recorded GIUSAXS and GTSAXS patterns revealed features characteristic of near-surface hexagonally ordered monolayers and multilayer assemblies, validating the system's resolution and sensitivity. The proposed scheme enables selective depth profiling and expands the research capabilities of existing small-angle X-ray scattering synchrotron facilities for in situ studyies of submicrometre nanostructured objects at liquid surfaces under grazing-incidence geometry, while remaining fully compatible with complementary techniques such as grazing-incidence wide-angle scattering and total reflection X-ray fluorescence.

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