Metals
(Nov 2020)
High-Energy Ball Milling and Spark Plasma Sintering of the CoCrFeNiAl High-Entropy Alloy
Alexander S. Rogachev,
Nicholas A. Kochetov,
Anna V. Panteleeva,
Kirill V. Kuskov,
Dmitry Yu. Kovalev,
Alexander S. Shchukin,
Sergey G. Vadchenko,
Yury B. Scheck
Affiliations
Alexander S. Rogachev
Merzhanov Institute of Structural Macrokinetics and Materials Science, Russian Academy of Sciences, Chernogolovka, 142432 Moscow, Russia
Nicholas A. Kochetov
Merzhanov Institute of Structural Macrokinetics and Materials Science, Russian Academy of Sciences, Chernogolovka, 142432 Moscow, Russia
Anna V. Panteleeva
Center of Functional Nanoceramics, National University of Science and Technology MISiS, 119049 Moscow, Russia
Kirill V. Kuskov
Center of Functional Nanoceramics, National University of Science and Technology MISiS, 119049 Moscow, Russia
Dmitry Yu. Kovalev
Merzhanov Institute of Structural Macrokinetics and Materials Science, Russian Academy of Sciences, Chernogolovka, 142432 Moscow, Russia
Alexander S. Shchukin
Merzhanov Institute of Structural Macrokinetics and Materials Science, Russian Academy of Sciences, Chernogolovka, 142432 Moscow, Russia
Sergey G. Vadchenko
Merzhanov Institute of Structural Macrokinetics and Materials Science, Russian Academy of Sciences, Chernogolovka, 142432 Moscow, Russia
Yury B. Scheck
Merzhanov Institute of Structural Macrokinetics and Materials Science, Russian Academy of Sciences, Chernogolovka, 142432 Moscow, Russia
DOI
https://doi.org/10.3390/met10111489
Journal volume & issue
Vol. 10,
no. 11
Abstract
Read online
Nanocrystalline powder of the CoCrFeNiAl high-entropy alloy was produced by high-energy ball milling (HEBM) and consolidated by spark plasma sintering (SPS). Microstructure and crystal structure transformations occurring in the course of HEBM and SPS processes were explored by Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS) and X-Rays Diffraction (XRD) methods. Synthesized materials showed a microhardness of 4000–6000 MPa and electrical resistivity of 0.2 mΩ⋅cm at room temperature.
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