Depth Measurement Error Analysis and Structural Parameter Correction of Structured Light Depth Imager
Shuang Yu,
Haoran Guo,
Wenlong Yang,
Yanqiao Zhao,
Haibin Wu,
Xiaoming Sun,
Xiaoyang Yu
Affiliations
Shuang Yu
Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin 150080, China
Haoran Guo
Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin 150080, China
Wenlong Yang
Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin 150080, China
Yanqiao Zhao
Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin 150080, China
Haibin Wu
Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin 150080, China
Xiaoming Sun
Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin 150080, China
Xiaoyang Yu
Heilongjiang Province Key Laboratory of Laser Spectroscopy Technology and Application, Harbin University of Science and Technology, Harbin 150080, China
Considering that structured light depth imagers are difficult to use for precision measurements due to their limited measurement accuracy, we propose an innovative method for correcting structural parameters of structured light depth imagers to reduce the depth measurement error caused by structural parameter errors. For the structured light depth imager, the analytical imaging model is established, and the model of depth error caused by structural parameter errors is established based on the analysis of the depth measurement error analysis. Then, structural parameters are corrected according to the depth measurement error analysis and processing based on experimental depth imaging data of the standard reference plane at the maximum depth. As a result, the corrected analytical imaging model and corrected depth measurement values are obtained. Experimental results have demonstrated the success of this proposed method and its simplicity and convenience.
