Polarimeters for the Detection of Anisotropy from Reflectance
Shuji Kamegaki,
Zahra Khajehsaeidimahabadi,
Meguya Ryu,
Nguyen Hoai An Le,
Soon Hock Ng,
Ričardas Buividas,
Gediminas Seniutinas,
Vijayakumar Anand,
Saulius Juodkazis,
Junko Morikawa
Affiliations
Shuji Kamegaki
School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan
Zahra Khajehsaeidimahabadi
Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia
Meguya Ryu
National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 3, 1-1-1 Umezono, Tsukuba 305-8563, Ibaraki, Japan
Nguyen Hoai An Le
Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia
Soon Hock Ng
Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia
Ričardas Buividas
Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia
Gediminas Seniutinas
Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia
Vijayakumar Anand
Institute of Physics, University of Tartu, W. Ostwaldi 1, 50411 Tartu, Estonia
Saulius Juodkazis
Optical Sciences Centre, ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), Swinburne University of Technology, Hawthorn, VIC 3122, Australia
Junko Morikawa
School of Materials and Chemical Technology, Tokyo Institute of Technology, Ookayama, Meguro-ku, Tokyo 152-8550, Japan
Polarimetry is used to determine the Stokes parameters of a laser beam. Once all four S0,1,2,3 parameters are determined, the state of polarisation is established. Upon reflection of a laser beam with the defined S polarisation state, the directly measured S parameters can be used to determine the optical properties of the surface, which modify the S-state upon reflection. Here, we use polarimetry for the determination of surface anisotropies related to the birefringence and dichroism of different materials, which have a common feature of linear patterns with different alignments and scales. It is shown that polarimetry in the back-reflected light is complementary to ellipsometry and four-polarisation camera imaging; experiments were carried out using a microscope.
