IEEE Access (Jan 2017)

Improving Peak-Wavelength Method to Measure Junction Temperature by Dual-Wavelength LEDs

  • Yukun Zhao,
  • Feng Yun,
  • Lungang Feng,
  • Shuai Wang,
  • Yufeng Li,
  • Xilin Su,
  • Maofeng Guo,
  • Wen Ding,
  • Ye Zhang

DOI
https://doi.org/10.1109/ACCESS.2017.2716781
Journal volume & issue
Vol. 5
pp. 11712 – 11716

Abstract

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In this paper, the improvement of the method measuring the junction temperature of lightemitting diodes (LEDs) has been studied experimentally. A practical method is proposed with only three measurement procedures. With the consideration of indium (In) composition and blue shift, the method has a high applicability, which is practical for the LED chips vary from blue to green chips under different currents, including the packaged chips. On the other hand, according to the experimental and derived results, the junction-temperature difference and peak-wavelength shift in both blue-shift and red-shift fields show similar parabolic-like relations. To simplify the experimental processes, dual-wavelength LEDs were fabricated and measured instead of conventional single-wavelength LEDs.

Keywords