A simplified formulation for calculation of minority-carrier effective lifetime

Abstract

An improved simple equation to calculate the minority-carrier effective lifetime in photoconductance measurements is proposed by the perturbation method. When the given constraints are satisfied, the given formulation leads to a fast and accurate determination of effective lifetime from the bulk lifetime, surface recombination velocity, the thickness of the wafer, and diffusion coefficient. Keywords: Photoconductance, Lifetime, Recombination, Perturbation method