A fast X-corner detection method based on block-search strategy

Abstract

In order to detect X-corner (or X-point) features more accurately and apace, this article presents a novel and fast detection method based on block-by-block search strategy. Unlike general pixel-by-pixel searching method, the sampling window is first moved along the image block-by-block to find the X-corner candidates rapidly keeping in view the four-step and min-step-distance constraints. During the motion, some overlap is kept between the adjacent sampling windows in order to ensure that all X-corners could have a chance to reside inside, avoiding the possibility of that some X-corners may locate on the edge. Moreover, labeling technology is adopted to prevent duplicate candidates. After the collection of X-corner candidates, the neighborhood variance and centrosymmetry constraints are used to exclude outliers, and the intersection lines is calculated as the sub-pixel position of true X-corner. The experimental results using synthetic and real images show that the presented method approximately takes just about 13 ms to detect 52 X-corners in an image size of 1024 × 768 on a computer having Intel Core i3 CPU at 3.6 GHz and 4GB RAM. The proposed method has faster detection speed compared with the latest methods such as ChESS, SC, and Micron Tracker system while possessing the same or higher detection precision.