A Survey of Electromagnetic Radiation Based Hardware Assurance and Reliability Monitoring Methods in Integrated Circuits

Abstract

Electromagnetic (EM) radiation-based hardware assurance methods are gaining prominence due to their non-invasive nature of monitoring the chip activity and the potential for continuous monitoring of integrated circuits (ICs) during operation. This paper presents an in-depth survey on the existing EM-based strategies for detecting hardware Trojans, counterfeit components, and monitoring the reliability of ICs. The paper discusses diverse methods of capturing EM emissions, with traditional near-field probes and the emerging on-chip antenna structures, while discussing the benefits and challenges associated with each method for continuous ICs monitoring to improve their security and reliability. Furthermore, the survey provides a comprehensive summary of the experimental setups and analytical techniques employed in earlier works for enhancing the security and reliability of ICs. This survey paper advances our knowledge of EM-based hardware assurance techniques to monitor the reliability of ICs.

Keywords

• Aging
• counterfeit detection
• electromagnetic emissions
• electromigration
• hardware Trojan detection
• on-chip EM sensor