EPJ Web of Conferences (Jan 2018)

Investigation of the properties of a 3-level broadband antireflective structure on silicon by THz time-domain spectroscopy

  • Tzibizov I.A.,
  • Kropotov G.I.,
  • Pavelyev V.S.,
  • Tukmakov K.N.,
  • Reshetnikov A.S.

DOI
https://doi.org/10.1051/epjconf/201819506016
Journal volume & issue
Vol. 195
p. 06016

Abstract

Read online

No abstracts available.