Method for evaluating the quality of thin-film board

Abstract

A method for estimation of the quality of a thin-film board has been developed, based on the results of resistance measuring and instrumental errors calculation. Recommendations are given for the exclusion of gross errors in the application of the method. The practical estimation carried out shows the high efficiency of the developed algorithms. This method allows to increase the boards yield by 1,5—2 times.

Keywords

• thin-film resistor
• resistance instrumental error