Development of image-based wheat spike counter through a Faster R-CNN algorithm and application for genetic studies
Lei Li,
Muhammad Adeel Hassan,
Shurong Yang,
Furong Jing,
Mengjiao Yang,
Awais Rasheed,
Jiankang Wang,
Xianchun Xia,
Zhonghu He,
Yonggui Xiao
Affiliations
Lei Li
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China
Muhammad Adeel Hassan
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China
Shurong Yang
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China
Furong Jing
Electronic Information School, Foshan Polytechnic, Foshan 528137, Guangdong, China
Mengjiao Yang
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China
Awais Rasheed
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China; International Maize and Wheat Improvement Centre (CIMMYT) China Office, c/o CAAS, Beijing 100081, China; Department of Plant Sciences, Quaid-i-Azam University, Islamabad 44000, Pakistan
Jiankang Wang
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China
Xianchun Xia
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China
Zhonghu He
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China; International Maize and Wheat Improvement Centre (CIMMYT) China Office, c/o CAAS, Beijing 100081, China; Corresponding authors.
Yonggui Xiao
Institute of Crop Sciences, National Wheat Improvement Centre, Chinese Academy of Agricultural Sciences (CAAS), Beijing 100081, China; Corresponding authors.
Spike number (SN) per unit area is one of the major determinants of grain yield in wheat. Development of high-throughput techniques to count SN from large populations enables rapid and cost-effective selection and facilitates genetic studies. In the present study, we used a deep-learning algorithm, i.e., Faster Region-based Convolutional Neural Networks (Faster R-CNN) on Red-Green-Blue (RGB) images to explore the possibility of image-based detection of SN and its application to identify the loci underlying SN. A doubled haploid population of 101 lines derived from the Yangmai 16/Zhongmai 895 cross was grown at two sites for SN phenotyping and genotyped using the high-density wheat 660K SNP array. Analysis of manual spike number (MSN) in the field, image-based spike number (ISN), and verification of spike number (VSN) by Faster R-CNN revealed significant variation (P < 0.001) among genotypes, with high heritability ranged from 0.71 to 0.96. The coefficients of determination (R2) between ISN and VSN was 0.83, which was higher than that between ISN and MSN (R2 = 0.51), and between VSN and MSN (R2 = 0.50). Results showed that VSN data can effectively predict wheat spikes with an average accuracy of 86.7% when validated using MSN data. Three QTL Qsnyz.caas-4DS, Qsnyz.caas-7DS, and QSnyz.caas-7DL were identified based on MSN, ISN and VSN data, while QSnyz.caas-7DS was detected in all the three data sets. These results indicate that using Faster R-CNN model for image-based identification of SN per unit area is a precise and rapid phenotyping method, which can be used for genetic studies of SN in wheat.