Improving Neural Network-Based Multi-Label Classification With Pattern Loss Penalties

Abstract

This research work introduces two novel loss functions, pattern-loss (POL) and label similarity-based instance modeling (LSIM), for improving the performance of multi-label classification using artificial neural network-based techniques. These loss functions incorporate additional optimization constraints based on the distribution of multi-label class patterns and the similarity of data instances. By integrating these patterns during the network training process, the trained model is tuned to align with the existing patterns in the training data. The proposed approach decomposes the loss function into two components: the cross entropy loss and the pattern loss derived from the distribution of class-label patterns. Experimental evaluations were conducted on eight standard datasets, comparing the proposed methods with three existing techniques.The results demonstrate the effectiveness of the proposed approach, with POL and LSIM consistently achieving superior accuracy performance compared to the benchmark methods.

Keywords

• Multi-label classification
• label correlation
• label-specific features
• deep neural network
• loss functions