Key Technologies in Developing Chip-Scale Hot Atomic Devices for Precision Quantum Metrology
Huiyao Yu,
Xuyuan Zhang,
Jian Zhang,
Zhendong Wu,
Long Jiao,
Kan Li,
Wenqiang Zheng
Affiliations
Huiyao Yu
Zhejiang Provincial Key Laboratory and Collaborative Innovation Center for Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou 310023, China
Xuyuan Zhang
Zhejiang Provincial Key Laboratory and Collaborative Innovation Center for Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou 310023, China
Jian Zhang
Zhejiang Provincial Key Laboratory and Collaborative Innovation Center for Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou 310023, China
Zhendong Wu
Zhejiang Provincial Key Laboratory and Collaborative Innovation Center for Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou 310023, China
Long Jiao
College of Mechanical Engineering, Zhejiang University of Technology, Hangzhou 310023, China
Kan Li
Zhejiang Provincial Key Laboratory and Collaborative Innovation Center for Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou 310023, China
Wenqiang Zheng
Zhejiang Provincial Key Laboratory and Collaborative Innovation Center for Quantum Precision Measurement, College of Science, Zhejiang University of Technology, Hangzhou 310023, China
Chip-scale devices harnessing the interaction between hot atomic ensembles and light are pushing the boundaries of precision measurement techniques into unprecedented territory. These advancements enable the realization of super-sensitive, miniaturized sensing instruments for measuring various physical parameters. The evolution of this field is propelled by a suite of sophisticated components, including miniaturized single-mode lasers, microfabricated alkali atom vapor cells, compact coil systems, scaled-down heating systems, and the application of cutting-edge micro-electro-mechanical system (MEMS) technologies. This review delves into the essential technologies needed to develop chip-scale hot atomic devices for quantum metrology, providing a comparative analysis of each technology’s features. Concluding with a forward-looking perspective, this review discusses the future potential of chip-scale hot atomic devices and the critical technologies that will drive their advancement.
