Nature Communications (Jul 2022)
Origin of giant electric-field-induced strain in faulted alkali niobate films
- Moaz Waqar,
- Haijun Wu,
- Khuong Phuong Ong,
- Huajun Liu,
- Changjian Li,
- Ping Yang,
- Wenjie Zang,
- Weng Heng Liew,
- Caozheng Diao,
- Shibo Xi,
- David J. Singh,
- Qian He,
- Kui Yao,
- Stephen J. Pennycook,
- John Wang
Affiliations
- Moaz Waqar
- Department of Materials Science and Engineering, National University of Singapore
- Haijun Wu
- State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University
- Khuong Phuong Ong
- Institute of High Performance Computing, A*STAR (Agency for Science, Technology and Research)
- Huajun Liu
- Institute of Materials Research and Engineering (IMRE), A*STAR (Agency for Science, Technology and Research)
- Changjian Li
- Department of Materials Science and Engineering, National University of Singapore
- Ping Yang
- Department of Materials Science and Engineering, National University of Singapore
- Wenjie Zang
- Department of Materials Science and Engineering, National University of Singapore
- Weng Heng Liew
- Institute of Materials Research and Engineering (IMRE), A*STAR (Agency for Science, Technology and Research)
- Caozheng Diao
- Singapore Synchrotron Light Source (SSLS), National University of Singapore
- Shibo Xi
- Institute of Chemical and Engineering Sciences, A*STAR (Agency for Science, Technology and Research)
- David J. Singh
- Department of Physics and Astronomy and Department of Chemistry, University of Missouri
- Qian He
- Department of Materials Science and Engineering, National University of Singapore
- Kui Yao
- Institute of Materials Research and Engineering (IMRE), A*STAR (Agency for Science, Technology and Research)
- Stephen J. Pennycook
- Department of Materials Science and Engineering, National University of Singapore
- John Wang
- Department of Materials Science and Engineering, National University of Singapore
- DOI
- https://doi.org/10.1038/s41467-022-31630-8
- Journal volume & issue
-
Vol. 13,
no. 1
pp. 1 – 9
Abstract
Maximizing the electromechanical response is crucial for developing piezoelectric devices. Here, the authors demonstrate a giant electric-field-induced strain and its origin in alkali niobate epitaxial thin films with self-assembled planar faults.
