Informacije MIDEM (Dec 2021)

Reduction of Random Dopant Fluctuation-induced Variation in Junctionless FinFETs via Negative Capacitance Effect

  • B. Liu,
  • X. Chen,
  • Z. Xie,
  • M. Guo,
  • M. Zhao,
  • W. Lü

DOI
https://doi.org/10.33180/InfMIDEM2021.405
Journal volume & issue
Vol. 51, no. 4
pp. 253 – 259

Abstract

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Keywords