EURASIP Journal on Advances in Signal Processing (Jan 2010)

Two-Stage Outlier Elimination for Robust Curve and Surface Fitting

  • Jieqi Yu,
  • Haipeng Zheng,
  • Sanjeev R. Kulkarni,
  • H. Vincent Poor

DOI
https://doi.org/10.1155/2010/154891
Journal volume & issue
Vol. 2010

Abstract

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