Observation of Backflow during the Anihilation of Topologocal Defects in Freely Suspended Smectic Films

Abstract

Freely suspended films in the smectic C phase are excellent templates for the study of topological defect dynamics. It is well known that, during the annihilation of a pair of disclinations with strengths +/−1, the +1 defect moves faster because it is carried towards its opponent by backflow, whereas the flow in the vicinity of the −1 defect is negligibly small. This backflow pattern is created by the defect motion itself. An experimental confirmation of this theoretical prediction and its quantitative characterization is achieved here by fluorescence labeling. Film regions near the defect positions are labeled and their displacements are tracked optically.

Keywords

• topological defect annihilation
• freely suspended smectic films
• backflow
• fluorescence bleaching