Ghost-imaging-enhanced noninvasive spectral characterization of stochastic x-ray free-electron-laser pulses

Abstract

X-ray free-electron lasers (XFELs) are powerful tools to explore x-ray interactions in atomic and molecular systems at femtosecond timescales. The authors demonstrate a transparent beamsplitter that uses photoelectron spectroscopy combined with a ghost-imaging algorithm to characterize the spiky spectral structure of individual XFEL pulses.