AIP Advances (Sep 2021)

Temperature response for active thermography using laser scanning heating and method of images

  • Tsutomu Hoshimiya,
  • Haruo Endoh

DOI
https://doi.org/10.1063/5.0048160
Journal volume & issue
Vol. 11, no. 9
pp. 095204 – 095204-16

Abstract

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When scanning a specimen using a line heat source at a constant velocity, a temperature change occurs partly due to specular reflection at the defect interface. Assuming that the reflection of a transient thermal response is similar to that of geometrical optics, we performed waveform analysis using an imaging method. Image points are calculated based on differential geometry; this can also be performed for a curved surface using a general equation. A combination of the steepest descent analysis of a moving heat source problem and a convolution technique successfully yielded waveforms comparable to those of experimental temperature responses. We designed and constructed an active thermographic imaging system in which a linearly focused continuous wave laser beam was scanned perpendicular to the beam as it covered the entire surface of specimens with simulated internal defects. The real-time response was recorded as a temperature waveform at each image pixel. Waveforms were calculated for specimens without or with buried cylindrical defects parallel to their surfaces and compared to the experimental data. The theory well-explains the signal generation mechanism, and excellent agreement was obtained in waveforms. Some discrepancy between theory and experiment indicates more complicated problems in heat and mass transfer.