IEEE Photonics Journal (Jan 2020)

Scatterometer and Intensity Distribution Meter With Screen Image Synthesis

  • Yeh-Wei Yu,
  • Tsung-Hsun Yang,
  • Ching-Cherng Sun,
  • Yun-Hsuan Lin,
  • Ming Le,
  • Chih-Wei Chen,
  • Po-Kai Hsieh,
  • X. H. Lee

DOI
https://doi.org/10.1109/JPHOT.2020.3025485
Journal volume & issue
Vol. 12, no. 5
pp. 1 – 12

Abstract

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A screen image synthesis (SIS) system is superior than the conventional methods in terms of high-speed measurement and low screen-cross-talk noise when used as a whole-field light-distribution meter. However, reflection signals cannot be measured using the conventional SIS system when it is used as a scattering meter. Furthermore, the conventional SIS system cannot be used to measure a large sample when it is used as an intensity distribution meter. In this study, we devised a rail-based SIS system as long as an image reconstruction algorithm. This would allow whole-field scattering light and intensity distribution measurements for various sample sizes. For this purpose, a versatile instrument was assembled by combining a whole-field intensity distribution meter and a whole-field scattering meter. The results of the experiments confirmed that the measuring time was drastically improved when the proposed instrument was used as a whole-field intensity distribution meter and a whole-field scattering meter. The high normalized cross correlation values of both measurements demonstrated the accuracy and feasibility of the proposed algorithm.

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