ACS Omega
(Oct 2023)
Accurate Measurement of Defect Generation Rates in Silicon Carbide Irradiated with Energetic Ions
- Linxin Guo,
- Shengyuan Peng,
- Yong Liu,
- Shang Tian,
- Wei Zhou,
- Hao Wang,
- Jianming Xue
Affiliations
- Linxin Guo
- State Key Laboratory of Nuclear Physics and Technology, School of Physics, Peking University, Beijing, P. R. China
- Shengyuan Peng
- State Key Laboratory of Nuclear Physics and Technology, School of Physics, Peking University, Beijing, P. R. China
- Yong Liu
- State Key Laboratory of Nuclear Physics and Technology, School of Physics, Peking University, Beijing, P. R. China
- Shang Tian
- State Key Laboratory of Nuclear Physics and Technology, School of Physics, Peking University, Beijing, P. R. China
- Wei Zhou
- Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang, P. R. China
- Hao Wang
- Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mianyang, P. R. China
- Jianming Xue
- State Key Laboratory of Nuclear Physics and Technology, School of Physics, Peking University, Beijing, P. R. China
- DOI
-
https://doi.org/10.1021/acsomega.3c07568
- Journal volume & issue
-
Vol. 8,
no. 44
pp.
41977
– 41982
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