Machine vision inspection of early failure and line-shaped defects of blue InGaN/GaN light emitting diodes soaked in liquid nitrogen for cryogenic tests

Chun-Yen Yang; Chih-Yuan Yu; You-Li Lin; Mou-Tuong Hon; Shao-Jui Yang; Yi-Zong Zhang; Hsuan-Chia Kang; Yaw-Wen Kuo; Chia-Feng Lin; You-Lin Wu; Hsin-Hung Chou; Hsiang Chen; Yung-Hui Li; Jung Han

Results in Physics (Jul 2023)

Machine vision inspection of early failure and line-shaped defects of blue InGaN/GaN light emitting diodes soaked in liquid nitrogen for cryogenic tests

Chun-Yen Yang,
Chih-Yuan Yu,
You-Li Lin,
Mou-Tuong Hon,
Shao-Jui Yang,
Yi-Zong Zhang,
Hsuan-Chia Kang,
Yaw-Wen Kuo,
Chia-Feng Lin,
You-Lin Wu,
Hsin-Hung Chou,
Hsiang Chen,
Yung-Hui Li,
Jung Han

Affiliations

Chun-Yen Yang: Department of Electrical Engineering, National Chi Nan University, Nantou 54561, Taiwan
Chih-Yuan Yu: Department of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Nantou 54561, Taiwan
You-Li Lin: Department of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Nantou 54561, Taiwan
Mou-Tuong Hon: Department of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Nantou 54561, Taiwan
Shao-Jui Yang: Department of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Nantou 54561, Taiwan
Yi-Zong Zhang: Department of Computer Science & Information Engineering, National Chi Nan University, Nantou 54561, Taiwan
Hsuan-Chia Kang: Department of Computer Science & Information Engineering, National Chi Nan University, Nantou 54561, Taiwan
Yaw-Wen Kuo: Department of Electrical Engineering, National Chi Nan University, Nantou 54561, Taiwan
Chia-Feng Lin: Department of Materials Science and Engineering, National Chung Hsing University, Taichung 40227, Taiwan
You-Lin Wu: Department of Electrical Engineering, National Chi Nan University, Nantou 54561, Taiwan
Hsin-Hung Chou: Department of Computer Science & Information Engineering, National Chi Nan University, Nantou 54561, Taiwan; Corresponding authors.
Hsiang Chen: Department of Applied Materials and Optoelectronic Engineering, National Chi Nan University, Nantou 54561, Taiwan; Corresponding authors.
Yung-Hui Li: AI Research Center, Hon Hai Research Institute, Taipei 11494, Taiwan
Jung Han: Department of Electrical Engineering, Yale University, New Haven, CT 06511, USA

Journal volume & issue: Vol. 50
p. 106594

Abstract

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Cryogenic tests were conducted on blue InGaN/GaN light-emitting diodes (LEDs) by immersing the device in liquid nitrogen (LN2). To study the degradation of the LEDs, a combination of optical, electrical, and material characterizations were performed on the LN2-soaked device. The results indicate that noticeable emission spectral shifts were observed during the LED immersion due to lattice deformation. Moreover, clustering of cracks was generated in the cross-section, and line-shaped defects appeared on the surface of the GaN LED, which was different from the defects on AlInGaP LEDs after LN2 immersion. To track the trend of device damage, computer-assisted OpenCV-Python software was used to zoom in on nuanced variations in certain areas of the emission images. Early degradation of certain areas can be detected by computer-assisted machine vision, which has the potential to provide an early warning and protective circuits for the system consisting of the initial degraded LEDs. Reliability studies on LN2-soaked InGaN/GaN LEDs show promise in studying the reliability issues of GaN device applications in Arctic regions and space exploration.

Published in Results in Physics

ISSN: 2211-3797 (Online)
Publisher: Elsevier
Country of publisher: Netherlands
LCC subjects: Science: Physics
Website: http://www.journals.elsevier.com/results-in-physics/

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