Nanomaterials (May 2024)

Magnetic-Dielectric Cantilevers for Atomic Force Microscopy

  • Gala Sanchez-Seguame,
  • Hugo Avalos-Sanchez,
  • Jesus Eduardo Lugo,
  • Eduardo Antonio Murillo-Bracamontes,
  • Martha Alicia Palomino-Ovando,
  • Orlando Hernández-Cristobal,
  • José Juan Gervacio-Arciniega,
  • Miller Toledo-Solano

DOI
https://doi.org/10.3390/nano14100874
Journal volume & issue
Vol. 14, no. 10
p. 874

Abstract

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Atomic force microscopy (AFM) is a technique that relies on detecting forces at the nanonewton scale. It involves using a cantilever with a tiny tip at one end. This tip interacts with the short- and long-range forces of material surfaces. These cantilevers are typically manufactured with Si or Si3N4 and synthesized using a lithography technique, which implies a high cost. On the other hand, through simple chemical methods, it is possible to synthesize a magneto-dielectric composite made up of artificial SiO2 opals infiltrated with superparamagnetic nanoparticles of Fe3O4. From these materials, it is possible to obtain tipless cantilevers that can be used in AFM analysis. Tipless cantilevers are an alternative tool in nanoscale exploration, offering a versatile approach to surface analysis. Unlike traditional AFM probes, tipless versions eliminate the challenges associated with tip wear, ensuring prolonged stability during measurements. This makes tipless AFM particularly valuable for imaging delicate or soft samples, as it prevents sample damage and provides precise measurements of topography and mechanical and electromechanical properties. This study presents the results of the characterization of known surfaces using magneto-dielectric cantilevers and commercial cantilevers based on Si. The characterization will be carried out through contact and non-contact topography measurements.

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