Beilstein Journal of Nanotechnology (Jul 2016)

Advanced atomic force microscopy techniques III

Thilo Glatzel,
Thomas Schimmel

Affiliations

Thilo Glatzel: Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland
Thomas Schimmel: Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76021 Karlsruhe, Germany

DOI: https://doi.org/10.3762/bjnano.7.98
Journal volume & issue: Vol. 7, no. 1
pp. 1052 – 1054

Abstract

No abstracts available.

atomic force microscopy

Published in Beilstein Journal of Nanotechnology

ISSN: 2190-4286 (Online)
Publisher: Beilstein-Institut
Country of publisher: Germany
LCC subjects: Technology: Chemical technology; Science: Physics
Website: http://www.beilstein-journals.org/bjnano/home/home.htm

About the journal