Journal of Electromagnetic Engineering and Science (May 2023)

Modeling and Prediction of Common Mode Electromagnetic Interference in GaN-Based Switching Power Converters

  • Chuang Bi,
  • Heyang Shan,
  • Kai Gao,
  • Shaojing Wang,
  • Peng Xu

DOI
https://doi.org/10.26866/jees.2023.3.r.163
Journal volume & issue
Vol. 23, no. 3
pp. 233 – 243

Abstract

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Behavioral models of common mode (CM) electromagnetic interference (EMI) are proposed herein for a GaN high-electron-mobility transistor (HEMT) synchronous buck converter. First, a CM noise model is developed using a linear equivalent circuit that consists of a voltage source, current source, and two noise impedances. The behavioral parameters of the CM model are then extracted by changing the input-side shunt impedances. A GaN HEMT buck converter setup is then built using switching frequencies of 100 kHz, 200 kHz, and 500 kHz to verify the validity of the CM EMI behavioral model. A comparison between the experimental and predicted results indicated that the proposed CM EMI model of GaN-based power converters was able to predict well the CM EMI current in the 150 kHz–30 MHz frequency range.

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