In situ X-ray area detector flat-field correction at an operating photon energy without flat illumination. Corrigendum

Affiliations

James Weng: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Wenqian Xu: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Kamila M. Wiaderek: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Olaf J. Borkiewicz: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Jiahui Chen: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Robert B. Von Dreele: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Leighanne C. Gallington: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA
Uta Ruett: X-ray Science Division, Advanced Photon Source, Argonne National Laboratory, Lemont, IL 60439, USA

Abstract

The name of an author in the article by Weng et al. (2023) [J. Synchrotron Rad. 30, 546–554] is corrected.

ISSN: 0909-0495 (Print); 1600-5775 (Online)
Publisher: International Union of Crystallography
Country of publisher: United Kingdom
LCC subjects: Science: Physics: Nuclear and particle physics. Atomic energy. Radioactivity; Science: Chemistry: Crystallography
Website: https://journals.iucr.org/s/