Distilling nanoscale heterogeneity of amorphous silicon using tip-enhanced Raman spectroscopy (TERS) via multiresolution manifold learning

Abstract

Short range atomic ordering quantification and nanoscale spatial resolution over a large area for amorphous materials is crucial for accelerating technology development but remain challenges. Here, the authors explore nanoscale heterogeneity of amorphous silicon by tip-enhanced Raman spectroscopy via multiresolution manifold learning.