Arbitrary cross-section SEM-cathodoluminescence imaging of growth sectors and local carrier concentrations within micro-sampled semiconductor nanorods

Abstract

Semiconductor nanocrystals are potential nanoelectronic materials but often display nonuniform electric properties due to their anisotropic growths. Here, the authors report cross-sectional cathodoluminescence imaging of a single-crystalline ZnO nanowire to resolve its growth sectors with different carrier concentrations.