Elemental Analysis of Lapis Lazuli sample, using complementary techniques of IBIL and MicroPIXE

Abstract

Ion Beam Induced Luminescence (IBIL) is a useful IBA technique which could be utilized to obtain information about the nature of chemical bonds in materials. Regarding the probed area, this non-destructive and fast technique is a suitable complementary one for MicroPIXE. Since most minerals are luminescent, IBIL is an applicable analytical technique in mineralogy. In this research work, to characterize a Lapis lazuli sample, a 2.7 MeV proton beam is utilized. After data collection and analysis of the results obtained from both techniques of IBIL and MicroPIXE, elemental maps of the sample were developed. Comparison of the results with other available ones in the literature indicates the capability and accuracy of the combination of the two complementary techniques for characterization of minerals as well as precious historical objects

Keywords

• ion beam induced luminescence
• microPIXE
• chemical imaging
• Lapis Lazuli