Electronics (Oct 2020)

Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems

  • Minji Cho,
  • Heechul Lee,
  • Doohyung Woo

DOI
https://doi.org/10.3390/electronics9101603
Journal volume & issue
Vol. 9, no. 1603
p. 1603

Abstract

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In this study, a novel IR projector driver that can minimize nonuniformity in electric circuits, using a dual-current-programming structure, is proposed to generate high-quality infrared (IR) scenes for accurate sensor evaluation. Unlike the conventional current-mode structure, the proposed system reduces pixel-to-pixel nonuniformity by assigning two roles (data sampling and current driving) to a single transistor. A prototype of the proposed circuit was designed and fabricated using the SK-Hynix 0.18 µm CMOS process, and its performance was analyzed using post-layout simulation data. It was verified that nonuniformity, which is defined as the standard deviation divided by the mean radiance, could be reduced from 21% to less than 0.1%.

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