Extraction and Analysis of Conducted Electromagnetic Susceptibility Elements of Integrated Circuits

Abstract

A new experimental research method on the electromagnetic susceptibility of integrated circuits (ICs) is proposed in this paper. This method is a new research topic based on seeking basic laws of chip electromagnetic susceptibility, aiming at providing an effective reference for chip electromagnetic compatibility (EMC) designers and users. Three different types of interference waveforms are used in the experimental process, in which the laws are analyzed and summarized by observing the experimental phenomena and results. The results indicate that the influence of various signal waveforms on the chip electromagnetic susceptibility presents certain regularity. The results also show that the influence of different chips on the electromagnetic susceptibility presents different characteristics under the same waveform interference. A large number of experiments have been carried out to derive the rules of chip electromagnetic susceptibility.

Keywords

• Integrated circuit (IC)
• conducted susceptibility
• electromagnetic compatibility (EMC)
• electromagnetic immunity
• conducted susceptibility phenomena