Technologies (Apr 2023)

Examination of Polymer Blends by AFM Phase Images

  • Enrico Werner,
  • Uwe Güth,
  • Bennet Brockhagen,
  • Christoph Döpke,
  • Andrea Ehrmann

DOI
https://doi.org/10.3390/technologies11020056
Journal volume & issue
Vol. 11, no. 2
p. 56

Abstract

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Atomic force microscopy (AFM) belongs to the high-resolution surface morphology investigation methods. Since it can, in many cases, be applied in air, samples can more easily be inspected than by a scanning electron microscope (SEM). In addition, several special modes exist which enable examination of the mechanical and other physical parameters of the specimen, such as friction, adhesion between tip and sample, elastic modulus, etc. In tapping mode, e.g., phase imaging can be used to qualitatively distinguish between different materials on the surface. This is especially interesting for polymers, for which the evaluation by energy-dispersive X-ray spectroscopy (EDS) is mostly irrelevant. Here we give an overview of phase imaging experiments on different filaments used for 3D printing by fused deposition modeling (FDM). Furthermore, the acrylonitrile butadiene styrene (ABS), especially different poly(lactide acids) (PLAs) with special features, such as thermochromic or photochromic properties, are investigated and compared with SEM images.

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