APL Materials (May 2018)

Preface: Materials, metrology, and modeling for a future beyond CMOS technology

  • G. Andrew Antonelli,
  • Dann Herr,
  • Sean W. King

DOI
https://doi.org/10.1063/1.5037331
Journal volume & issue
Vol. 6, no. 5
pp. 058001 – 058001-2

Abstract

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