IEEE Journal of Microwaves (Jan 2023)

Towards Intelligent Electromagnetic Inverse Scattering Using Deep Learning Techniques and Information Metasurfaces

  • Che Liu,
  • Hongrui Zhang,
  • Lianlin Li,
  • Tie Jun Cui

DOI
https://doi.org/10.1109/JMW.2022.3225999
Journal volume & issue
Vol. 3, no. 1
pp. 509 – 522

Abstract

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Electromagnetic inverse scattering (EMIS) is uniquely positioned among many inversion methods because it enables to image the scene in a contactless, quantitative and super-resolution way. Although many EMIS approaches have been proposed to date, they usually suffer from two important challenges, i.e., time-consuming data acquisition and computationally -prohibitive data post processing, especially for large-scale objects with high and even moderate contrasts. To tackle the challenges, we here propose a framework of intelligent EMIS with the aid of deep learning techniques and information metasurfaces, enabling to the efficient data acquisition and instant data processing in a smart way. Towards this goal, as illustrative examples, we considerably extend the canonical contrast source inversion (CSI) algorithm, a canonical EMIS method by updating the contrast via the generative adversarial network (GAN), an unsupervised deep learning approach, leading to a novel physics-informed unsupervised deep learning method for EMIS, referred to as CSI-GAN in short. Compared with existing deep learning solutions for EMIS, our method relies on the supervision of physical law instead of the labeled training dataset, beating the bottleneck arising from the collection of labeled training datasets. Furthermore, we propose a scheme of adaptive data acquisition with the use of information metasurface in a cost-efficiency way, remarkably reducing the number of measurements and thus speeding up the data acquisition but maintaining the reconstruction's quality. Illustrative examples are provided to demonstrate the performance gain in terms of reconstruction quality, showing the promising potentials for providing the intelligent scheme for the EMIS problems.

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