Research in Plant Disease (Sep 2013)

Establishment of Economic Threshold by Evaluation of Yield Component and Yield Damages Caused by Leaf Spot Disease of Soybean

  • Hongsik Shim,
  • Jong-Hyeong Lee,
  • Yong-Hwan Lee,
  • Inn-Shik Myung,
  • Hyo-Won Choi

DOI
https://doi.org/10.5423/RPD.2013.19.3.196
Journal volume & issue
Vol. 19, no. 3
pp. 196 – 200

Abstract

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This study was carried out to investigate yield loss due to soybean leaf spot disease caused by Cercospora sojina Hara and to determine the economic threshold level. The investigations revealed highly significant correlations between disease severity (diseased leaf area) and yield components (pod number per plant, total grain number per plant, total grain weight per plant, percent of ripened grain, weight of hundred seed, and yield). The correlation coefficients between leaf spot severity and each component were −0.90, −0.90, −0.92, −0.99, −0.90 and −0.94, respectively. The yield was inversely proportional to the diseased leaf area increased. The regression equation, yield prediction model, between disease severity (x) and yield (y) was obtained as y = −3.7213x + 354.99 (R2 = 0.9047). Based on the yield prediction model, economic injury level and economic threshold level could be set as 3.3% and 2.6% of diseased leaf area of soybean.

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