A novel probe fabrication process for improvement in scanning near-field optical microscopy

Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali. 2008;LXXXVI(1):c1a0801005 DOI 10.1478/C1A0801005

 

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Journal Title: Atti della Accademia Peloritana dei Pericolanti : Classe di Scienze Fisiche, Matematiche e Naturali

ISSN: 0365-0359 (Print); 1825-1242 (Online)

Publisher: Accademia Peloritana dei Pericolanti

Society/Institution: Accademia Peloritana dei Pericolanti

LCC Subject Category: Science: Science (General)

Country of publisher: Italy

Language of fulltext: Italian, English

Full-text formats available: PDF

 

AUTHORS

Cefali’, Eugenio

EDITORIAL INFORMATION

Peer review

Editorial Board

Instructions for authors

Time From Submission to Publication: 31 weeks

 

Abstract | Full Text

The full exploitation of the microscope potentialities as surface science tool on nanometer scale strictly depends on the probe features. Recent developments on fiber probes for Scanning Near Field Optical Microscope are reported. In this frame, new models and prototypes of probes with higher performances in terms of optical power efficiency and polarization selectivity are worked out. A new fabrication method of the probes is settled, based on a chemical etching process, which doubles the aspect ratio of the probe sharpness and improves the optical throughput. Moreover, Finite Domain Time Difference simulation allows the designing of a probe able to act as an evanescent field linear polarizer.