State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China
Jingtao Li
State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Electronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China
Quanyuan Feng
School of Information Science and Technology, Southwest Jiaotong University, Chengdu, China
Xiaopeng Diao
Chengdu Sino Microelectronics Technology Co.,Ltd., Chengdu, China
Lishuang Lin
Chengdu Sino Microelectronics Technology Co.,Ltd., Chengdu, China
Kelin Zhang
Chengdu Sino Microelectronics Technology Co.,Ltd., Chengdu, China
Haiding Sun
Advanced Semiconductor Laboratory, King Abdullah University of Science and Technology, Thuwal, Saudi Arabia
This paper presents a statistics-optimized organization technique to achieve better element matching in successive approximation register (SAR) analog-to-digital converter (ADC) in smart sensor systems. We demonstrate the proposed technique ability to achieve a significant improvement of around 23 dB on a spurious free dynamic range (SFDR) of the ADC than the conventional, testing with a capacitor mismatch σu = 0.2% in a 14-bit SAR ADC system. For the static performance, the max root mean square (rms) value of differential nonlinearity reduces from 1.63 to 0.20 LSB and the max rms value of integral nonlinearity (INL) reduces from 2.10 to 0.21 LSB. In addition, it is demonstrated that by applying grouping optimization and strategy optimization, the performance boosting on the SFDR can be effectively achieved. Such a great improvement on the resolution of the ADC only requires an off-line pre-processing digital part.
