Texture analysis of radiation sensitive organic films: Comparative study by electron diffraction tomography and GIWAXS

• Kraus Irene,
• Wu Mingjian,
• Rechberger Stefanie,
• Will Johannes,
• Maiti Santanu,
• Kuhlmann Andreas,
• Huck Marten,
• Steinberger Marc,
• Brabec Christoph,
• Steinrück Hans-Georg,
• Unruh Tobias,
• Spiecker Erdmann

Affiliations

Kraus Irene

Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg

Wu Mingjian

Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg

Rechberger Stefanie

Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg

Will Johannes

Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg

Maiti Santanu

Institute for Crystallography and Structural Physics (ICSP), FAU Erlangen-Nürnberg

Kuhlmann Andreas

Institute for a Sustainable Hydrogen Economy (INW), Forschungszentrum Jülich GmbH

Huck Marten

Institute for a Sustainable Hydrogen Economy (INW), Forschungszentrum Jülich GmbH

Steinberger Marc

Institute Materials for Electronics and Energy Technology (i-MEET), FAU Erlangen-Nürnberg

Brabec Christoph

Institute Materials for Electronics and Energy Technology (i-MEET), FAU Erlangen-Nürnberg

Steinrück Hans-Georg

Institute for a Sustainable Hydrogen Economy (INW), Forschungszentrum Jülich GmbH

Unruh Tobias

Institute for Crystallography and Structural Physics (ICSP), FAU Erlangen-Nürnberg

Spiecker Erdmann

Institute of Micro- and Nanostructure Research (IMN) & Center for Nanoanalysis and Electron Microscopy (CENEM), FAU Erlangen-Nürnberg