Author Correction: Highly accurate determination of heterogeneously stacked Van-der-Waals materials by optical microspectroscopy

• Andreas Hutzler,
• Birk Fritsch,
• Christian D. Matthus,
• Michael P. M. Jank,
• Mathias Rommel

Affiliations

Andreas Hutzler

Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg

Birk Fritsch

Electron Devices (LEB), Friedrich-Alexander University Erlangen-Nürnberg

Christian D. Matthus

Circuit Design and Network Theory, Technische Universität Dresden

Michael P. M. Jank

Fraunhofer Institute for Integrated Systems and Device Technology IISB

Mathias Rommel

Fraunhofer Institute for Integrated Systems and Device Technology IISB