Non-conventional mechanism of ferroelectric fatigue via cation migration

Anton V. Ievlev; Santosh KC; Rama K. Vasudevan; Yunseok Kim; Xiaoli Lu; Marin Alexe; Valentino R. Cooper; Sergei V. Kalinin; Olga S. Ovchinnikova

doi:10.1038/s41467-019-11089-w

Nature Communications (Jul 2019)

Non-conventional mechanism of ferroelectric fatigue via cation migration

Anton V. Ievlev,
Santosh KC,
Rama K. Vasudevan,
Yunseok Kim,
Xiaoli Lu,
Marin Alexe,
Valentino R. Cooper,
Sergei V. Kalinin,
Olga S. Ovchinnikova

Affiliations

Anton V. Ievlev: The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Santosh KC: Materials Science and Technology Division, Oak Ridge National Laboratory
Rama K. Vasudevan: The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Yunseok Kim: School of Advanced Materials Science and Engineering, Sungkyunkwan University
Xiaoli Lu: The State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, Xidian University
Marin Alexe: Department of Physics, University of Warwick
Valentino R. Cooper: Materials Science and Technology Division, Oak Ridge National Laboratory
Sergei V. Kalinin: The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
Olga S. Ovchinnikova: The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

DOI: https://doi.org/10.1038/s41467-019-11089-w
Journal volume & issue: Vol. 10, no. 1
pp. 1 – 8

Abstract

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Ferroelectric fatigue degrades ferroelectric properties upon polarization cycling, but its underlying chemistry is poorly understood. Here, the authors show by multimodal chemical imaging that fatigue in PbZr0.2Ti0.8O3 thin films is associated with Cu + ions migration from the electrode into the film structure.

Published in Nature Communications

ISSN: 2041-1723 (Online)
Publisher: Nature Portfolio
Country of publisher: United Kingdom
LCC subjects: Science
Website: https://www.nature.com/ncomms/

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