iScience (Jun 2019)

Giant Electroresistance in Ferroionic Tunnel Junctions

  • Jiankun Li,
  • Ning Li,
  • Chen Ge,
  • Heyi Huang,
  • Yuanwei Sun,
  • Peng Gao,
  • Meng He,
  • Can Wang,
  • Guozhen Yang,
  • Kuijuan Jin

DOI
https://doi.org/10.1016/j.isci.2019.05.043
Journal volume & issue
Vol. 16
pp. 368 – 377

Abstract

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Summary: Oxide-based resistive switching devices, including ferroelectric tunnel junctions and resistance random access memory, are promising candidates for the next-generation non-volatile memory technology. In this work, we propose a ferroionic tunnel junction to realize a giant electroresistance. It functions as a ferroelectric tunnel junction at low resistance state and as a Schottky junction at high resistance state, due to interface engineering through the field-induced migration of oxygen vacancies. An extremely large electroresistance with ON/OFF ratios of 5.1×107 at room temperature and 2.1×109 at 10 K is achieved, using an ultrathin BaTiO3-δ layer as the ferroelectric barrier and a semiconducting Nb-doped SrTiO3 substrate as the bottom electrode. The results point toward an appealing way for the design of high-performance resistive switching devices based on ultrathin oxide heterostructures by ionic controlled interface engineering. : Interface Science; Transport Property of Condensed Matter; Devices Subject Areas: Interface Science, Transport Property of Condensed Matter, Devices