Correction: Liu, B., et al. Quantitative Evaluation of Pulsed Thermography, Lock-In Thermography and Vibrothermography on Foreign Object Defect (FOD) in CFRP. Sensors 2016, 16, doi:10.3390/s16050743

Sensors (Jan 2017)

Affiliations

Bin Liu: School of Information Science and Engineering, Shenyang University of Technology, 111 Shenliao West Road, Shenyang 110870, China
Hai Zhang: Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la Médecine, QC G1V 0A6, Canada
Henrique Fernandes: Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la Médecine, QC G1V 0A6, Canada
Xavier Maldague: Department of Electrical and Computer Engineering, Computer Vision and Systems Laboratory, Laval University, 1065 av. de la Médecine, QC G1V 0A6, Canada

Abstract

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