Advances in Electrical and Electronic Engineering (Jan 2017)

Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

  • Dinara Sobola,
  • Stefan Talu,
  • Petr Sadovsky,
  • Nikola Papez,
  • Lubomir Grmela

DOI
https://doi.org/10.15598/aeee.v15i3.2242
Journal volume & issue
Vol. 15, no. 3
pp. 569 – 576

Abstract

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The wings scales of the butterflies were studied by Atomic Force Microscopy (AFM) in the air. Measurements were done without special preparation of species in order to observe the surface in real conditions. The data of probe microscopy (figures) confirm AFM to be a powerful technique for determining features of the insects' wings. These features play a key role in optical phenomena which makes fascinating wings coloration. The structure determines light reflection, propagation, and diffraction. AFM imaging was done at the areas of specific colors without scale separation.

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