The Reliability and Exploitation Analysis Method of the ICT System Power Supply with the Use of Modelling Based on Rough Sets
Marek Stawowy,
Adam Rosiński,
Jacek Paś,
Stanisław Duer,
Marta Harničárová,
Krzysztof Perlicki
Affiliations
Marek Stawowy
Faculty of Transport, Warsaw University of Technology, 75 Koszykowa St., 00-662 Warsaw, Poland
Adam Rosiński
Faculty of Transport, Warsaw University of Technology, 75 Koszykowa St., 00-662 Warsaw, Poland
Jacek Paś
Division of Electronic Systems Exploitations, Institute of Electronic Systems, Faculty of Electronics, Military University of Technology, 2 Gen. S. Kaliski St., 00-908 Warsaw, Poland
Stanisław Duer
Department of Energy, Faculty of Mechanical Engineering, Technical University of Koszalin, 15–17 Raclawicka St., 75-620 Koszalin, Poland
Marta Harničárová
Department of Mechanical Engineering, Faculty of Technology, Institute of Technology and Business in České Budějovice, Okružní 10, 370 01 České Budějovice, Czech Republic
Krzysztof Perlicki
Institute of Telecommunications, Faculty of Electronics and Information Technology, Warsaw University of Technology, Nowowiejska 15/19, 00-665 Warsaw, Poland
The article describes a new approach to the reliability–exploitation analysis of the critical information and communications technology (ICT) system power supply. A classic approach based on statistical indicators and a new one founded on uncertainty modelling based on the rough set method is presented. The main advantage of the uncertainty modelling approach is the simplification of the calculations and the fact that, unlike statistical analysis, uncertainty modelling does not require complete information on the used data sets. An extensive study of world publications was carried out, proving that this is an entirely innovative approach to solving the problem of reliability and exploitation analysis. Calculations, analyses and syntheses are also exhibited in a specific example. A sample of the ICT system power supply was simulated, and the simulation results are shown. The simulations were prepared by one of the co-authors for the purposes of this article.
