Deep learning-based single-shot phase retrieval algorithm for surface plasmon resonance microscope based refractive index sensing application

Abstract

Abstract A deep learning algorithm for single-shot phase retrieval under a conventional microscope is proposed and investigated. The algorithm has been developed using the context aggregation network architecture; it requires a single input grayscale image to predict an output phase profile through deep learning-based pattern recognition. Surface plasmon resonance imaging has been employed as an example to demonstrate the capability of the deep learning-based method. The phase profiles of the surface plasmon resonance phenomena have been very well established and cover ranges of phase transitions from 0 to 2π rad. We demonstrate that deep learning can be developed and trained using simulated data. Experimental validation and a theoretical framework to characterize and quantify the performance of the deep learning-based phase retrieval method are reported. The proposed deep learning-based phase retrieval performance was verified through the shot noise model and Monte Carlo simulations. Refractive index sensing performance comparing the proposed deep learning algorithm and conventional surface plasmon resonance measurements are also discussed. Although the proposed phase retrieval-based algorithm cannot achieve a typical detection limit of 10–7 to 10–8 RIU for phase measurement in surface plasmon interferometer, the proposed artificial-intelligence-based approach can provide at least three times lower detection limit of 4.67 × 10–6 RIU compared to conventional intensity measurement methods of 1.73 × 10–5 RIU for the optical energy of 2500 pJ with no need for sophisticated optical interferometer instrumentation.