Nanoscale Research Letters (Jun 2021)

A Study on the Effect of the Structural Parameters and Internal Mechanism of a Bilateral Gate-Controlled S/D Symmetric and Interchangeable Bidirectional Tunnel Field Effect Transistor

  • Xiaoshi Jin,
  • Yicheng Wang,
  • Kailu Ma,
  • Meile Wu,
  • Xi Liu,
  • Jong-Ho Lee

DOI
https://doi.org/10.1186/s11671-021-03561-8
Journal volume & issue
Vol. 16, no. 1
pp. 1 – 9

Abstract

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Abstract A bilateral gate-controlled S/D symmetric and interchangeable bidirectional tunnel field effect transistor (B-TFET) is proposed in this paper, which shows the advantage of bidirectional switching characteristics and compatibility with CMOS integrated circuits compared to the conventional asymmetrical TFET. The effects of the structural parameters, e.g., the doping concentrations of the N+ region and P+ region, length of the N+ region and length of the intrinsic region, on the device performances, e.g., the transfer characteristics, I on–I off ratio and subthreshold swing, and the internal mechanism are discussed and explained in detail.

Keywords