Structural and morphological dataset for rf-sputtered WC-Co thin films using synchrotron radiation methods
R.R. Phiri,
O.P. Oladijo,
H. Nakajima,
A. Rattanachata,
E.T. Akinlabi
Affiliations
R.R. Phiri
Department of Chemical, Materials and Metallurgical Engineering, Botswana International University of Science and Technology, Private Bag 16, Palapye, Botswana
O.P. Oladijo
Department of Chemical, Materials and Metallurgical Engineering, Botswana International University of Science and Technology, Private Bag 16, Palapye, Botswana; Department of Mechanical Engineering Science, University of Johannesburg, Kingsway Campus, Johannesburg, South Africa; Corresponding author. Department of Chemical, Materials and Metallurgical Engineering, Botswana International University of Science and Technology, Private Bag 16, Palapye, Botswana.
H. Nakajima
Synchrotron Light Research Institute, Nakhon Ratchasima, 30000, Thailand
A. Rattanachata
Synchrotron Light Research Institute, Nakhon Ratchasima, 30000, Thailand
E.T. Akinlabi
Department of Mechanical Engineering Science, University of Johannesburg, Kingsway Campus, Johannesburg, South Africa
Control and manipulation of synthesis parameters of thin film coatings is of critical concern in determination of material properties and performance. Structural and morphological properties of rf-sputtered WC-Co thin films deposited under varying deposition parameters namely, substrate temperature and rf power are presented in this data article. The surface morphology, crystallite size and nature were acquired using x-ray photoelectron spectroscopy (XPS) and Grazing Incidence X-ray absorption spectroscopy (GI-XAS). Furthermore, Synchrotron findings are correlated with complimentary data acquired from Scanning electron microscopy (SEM), Raman spectroscopy and surface profilometry to predict and point out optimum synthesis parameters for best properties of the film. Keywords: WC-Co thin films, X-ray photoelectron spectroscopy (XPS), Grazing incidence X-ray absorption spectroscopy (GI-XAS), Synchrotron radiation, SEM
